Evidence of kinetically stable glassy phase formation in ultrathin NdNiO3 films

Japanese Journal of Applied Physics

Volumn 51, Issue 11 PART2, 2012, Pages

  Prestgard, Megan Campbell ^a   Tiwari, Ashutosh ^a  

^a UNIVERSITY OF UTAH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOND ANGLE; CRITICAL THICKNESS; DEFECT FORMATION; ELECTRICAL RESISTIVITY; FREEDOM OF MOVEMENT; GLASSY PHASE; JAPAN SOCIETY OF APPLIED PHYSICS; LOW TEMPERATURES; MATERIAL PROPERTY; PLAUSIBLE MECHANISMS; PULSED-LASER DEPOSITION TECHNIQUE; STRAIN EFFECT; TEMPERATURE DEPENDENCE; TIME AND TEMPERATURE DEPENDENCE; TIME DEPENDENCE; TIME DEPENDENT; ULTRA-THIN;

DEFECTS; ELECTRIC CONDUCTIVITY; PULSED LASER DEPOSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; TEMPERATURE DISTRIBUTION;

ULTRATHIN FILMS;

EID: 84871386555     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.51.11PG08     Document Type: Conference Paper

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