Macroscale adhesion of gecko setae reflects nanoscale differences in subsurface composition

Journal of the Royal Society Interface

Volumn 10, Issue 78, 2013, Pages

  Loskill, Peter ^a   Puthoff, Jonathan ^b   Wilkinson, Matt ^b   Mecke, Klaus ^c   Jacobs, Karin ^a   Autumn, Kellar ^b  

^a SAARLAND UNIVERSITY   (Germany)

^b LEWIS AND CLARK COLLEGE   (United States)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Gecko adhesion; Surface energy; Van der Waals forces

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; INTERFACIAL ENERGY; MONOLAYERS; SILICON OXIDES; SILICON WAFERS; VAN DER WAALS FORCES;

ADHESION FORCES; ATOMIC LAYER; BILAYER MATERIALS; EMPIRICAL EVIDENCE; EXPERIMENTAL EVIDENCE; FUNCTIONALIZED; GECKO ADHESION; INHOMOGENEOUS MATERIALS; INTERFACIAL ADHESIONS; LAYER THICKNESS; LAYERED MATERIAL; LONG-RANGE FORCES; MACRO SCALE; MACROSCOPIC SURFACES; NANO SCALE; OCTADECYLTRICHLOROSILANE MONOLAYERS; OXIDE LAYER THICKNESS; SUBSURFACE LAYER; THEORETICAL CALCULATIONS; THEORETICAL RESULT; VAN DER WAALS ENERGIES; VAN DER WAALS INTERACTIONS;

ADHESION;

OCTADECYLTRICHLOROSILANE; OXIDE; SILANE DERIVATIVE; SILICON; SILICON DIOXIDE; UNCLASSIFIED DRUG; NANOMATERIAL;

ADHESION; ARTICLE; CHEMICAL INTERACTION; SURFACE PROPERTY; THICKNESS; VAN DER WAALS INTERACTION; CHEMICAL MODEL; CHEMISTRY; ULTRASTRUCTURE;

MODELS, CHEMICAL; NANOSTRUCTURES; SILANES; SILICON; SILICON DIOXIDE;

EID: 84871344252     PISSN: 17425689     EISSN: 17425662     Source Type: Journal    
DOI: 10.1098/rsif.2012.0587     Document Type: Article

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