A model for emission yield from planar photocathodes based on photon-enhanced thermionic emission or negative-electron-affinity photoemission

Journal of Applied Physics

Volumn 112, Issue 9, 2012, Pages

  Sahasrabuddhe, Kunal ^a,b   Schwede, Jared W ^a,b,c   Bargatin, Igor ^d,e   Jean, Joel ^f   Howe, Roger T ^d   Shen, Zhi Xun ^a,b,c   Melosh, Nicholas A ^a,c,d  

^a STANFORD UNIVERSITY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d Stanford University   (United States)

^e UNIVERSITY OF PENNSYLVANIA   (United States)

^f Department of Electrical Engineering and Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE THICKNESS; ELECTRON YIELD; EMISSION MECHANISM; EMISSION MODEL; EMISSION RATES; EMISSION YIELDS; GAAS; GENERAL MODEL; MATERIAL PARAMETER; NEGATIVE ELECTRON AFFINITY; RECOMBINATION VELOCITY; STEADY STATE DIFFUSION; SURFACE RECOMBINATIONS;

ELECTRODES; ENERGY CONVERSION; FIELD EMISSION CATHODES; PHOTOCATHODES; THERMIONIC EMISSION;

ELECTRON AFFINITY;

EID: 84870860658     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4764106     Document Type: Article

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