Mass spectrometric analysis of impurities in crystalline organic semiconductors

Organic Electronics

Volumn 14, Issue 1, 2013, Pages 378-388

  Voloshenko, A ^a   Tan, K J ^b   Kloc, C ^b   Lev, O ^a,b   Shelkov, M ^a   Sladkevich, S ^a   Prikhodchenko, P V ^a   Gun, J ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Anthracene; Crystalline organic semiconductors; GC SMB EI MS; Pentacene; Supersonic molecular beam (SMB); Tetracene

Indexed keywords

ANTHRACENE; CRYSTALLINE MATERIALS; DESORPTION; ELECTROSPRAY IONIZATION; INDUCTIVELY COUPLED PLASMA; ION SOURCES; IONIZATION OF GASES; MASS SPECTROMETERS; MASS SPECTROMETRY; MOLECULAR BEAMS; NAPHTHALENE; SEMICONDUCTING ORGANIC COMPOUNDS; SUPERSONIC AIRCRAFT; TEMPERATURE;

GC-SMB-EI-MS; MASS SPECTROMETRIC ANALYSIS; MATRIX ASSISTED LASER DESORPTION; PENTACENES; PHYSICAL VAPOR TRANSPORT; QUADRUPOLE MASS ANALYZERS; SUPERSONIC MOLECULAR BEAM; TETRACENE;

CRYSTAL IMPURITIES;

EID: 84870815651     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2012.11.012     Document Type: Article

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