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Volumn 111, Issue , 2013, Pages 112-118

New PFH-formulas for k-out-of-n:F-systems

Author keywords

DD failures; PFH; Proof test coverage; Reliability; Safety instrumented systems

Indexed keywords

RELIABILITY; RELIABILITY ANALYSIS;

EID: 84870776332     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2012.11.007     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.