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Volumn 24, Issue 1, 2011, Pages 49-56

Reliability assessment of safety instrumented systems subject to different demand modes

Author keywords

High demand; Low demand; Markov analysis; Reliability; Safety instrumented system

Indexed keywords

COMMONLY USED; DEMAND MODE; DEMAND RATES; HAZARDOUS EVENTS; HIGH-DEMAND; IEC 61508; IN-LINE; LOW-DEMAND; MARKOV ANALYSIS; MARKOV MODEL; PROBABILITY OF FAILURE ON DEMAND; PROCESS INDUSTRIES; RELIABILITY ASSESSMENTS; SAFETY INSTRUMENTED SYSTEMS; SIMPLE SYSTEM;

EID: 78650523371     PISSN: 09504230     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlp.2010.08.014     Document Type: Article
Times cited : (82)

References (13)
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  • 3
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    • Guo H., Yang X. A simple reliability block diagram method for safety integrity verification. Reliability Engineering and System Safety 2007, 92:1267-1274.
    • (2007) Reliability Engineering and System Safety , vol.92 , pp. 1267-1274
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    • Common cause failure modeling: status and trends
    • Springer, London, K.B. Misra (Ed.)
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    • (2008) Handbook of performability engineering , pp. 621-640
    • Hokstad, P.1    Rausand, M.2
  • 8
    • 78650520788 scopus 로고    scopus 로고
    • Contribution to modelling safety instrumented systems and to assessing their performance critical analysis of iec 61508 standard. Ph.D. thesis, University of Bordeaux
    • Innal, F. (2008). Contribution to modelling safety instrumented systems and to assessing their performance critical analysis of iec 61508 standard. Ph.D. thesis, University of Bordeaux.
    • (2008)
    • Innal, F.1
  • 10
    • 0033221363 scopus 로고    scopus 로고
    • Estimation of average hazardous-event frequency for allocation of safety-integrity levels
    • Misumi Y., Sato Y. Estimation of average hazardous-event frequency for allocation of safety-integrity levels. Reliability Engineering and System Safety 1999, 66:135-144.
    • (1999) Reliability Engineering and System Safety , vol.66 , pp. 135-144
    • Misumi, Y.1    Sato, Y.2
  • 12
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    • Safety achieved by the safe failure fraction (SFF) in IEC 61508
    • Yoshimura I., Sato Y. Safety achieved by the safe failure fraction (SFF) in IEC 61508. IEEE Transactions on Reliability 2008, 57:662-669.
    • (2008) IEEE Transactions on Reliability , vol.57 , pp. 662-669
    • Yoshimura, I.1    Sato, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.