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Volumn 5, Issue 4, 2009, Pages 377-386

Estimation of calendar-time- and process-operative-time-hazardous-event rates for the assessment of fatal risk

Author keywords

Calendar time hazardous event rate; Process operative time hazardous event rate; Protection layer; Risk analysis; Risk reduction

Indexed keywords


EID: 77955799763     PISSN: 09731318     EISSN: 29938341     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (10)

References (10)
  • 1
    • 0347900681 scopus 로고    scopus 로고
    • (2nd ed.), ISO guideline, Dec
    • ISO/IEC Guide 51 (2nd ed.), ISO guideline, Dec. 1999.
    • (1999) ISO/IEC Guide 51
  • 2
    • 77955779692 scopus 로고    scopus 로고
    • (1st ed.), IEC standard, Dec
    • IEC 61508 Part 1 (1st ed.), IEC standard, Dec. 1998.
    • (1998) IEC 61508 Part 1
  • 3
    • 85181159033 scopus 로고    scopus 로고
    • (1st ed.), IEC standard, Jan
    • IEC 61511 Part 1 (1st ed.), IEC standard, Jan. 2003.
    • (2003) IEC 61511 Part 1
  • 4
    • 85181074847 scopus 로고    scopus 로고
    • P65 of Ref.[2]
    • P65 of Ref.[2].
  • 5
    • 85181135351 scopus 로고    scopus 로고
    • 6 (1st ed.), IEC standard, April
    • IEC 61508 Part 6 (1st ed.), IEC standard, April 2000.
    • (2000) IEC 61508 Part
  • 9
    • 33745039755 scopus 로고    scopus 로고
    • State-transition Model of Safety-related Systems With Automatic Diagnosis and Its Formulation For Functional Safety Assessment
    • March, (in Japanese)
    • Kawahara, T., A. Ichitsuka, Y. Sato, State-transition model of safety-related systems with automatic diagnosis and its formulation for functional safety assessment (in Japanese), IEICE TRANS. A The Institute of Electronics, Information and Communication Engineers, Vol.J86-A, No.3, pp.241-249, March 2003.
    • (2003) IEICE TRANS. A The Institute of Electronics, Information and Communication Engineers , vol.J86-A , pp. 241-249
    • Kawahara, T.1    Ichitsuka, A.2    Sato, Y.3
  • 10
    • 57749117364 scopus 로고    scopus 로고
    • Safety Achieved By the Safe Failure Fraction (SFF) In IEC61508
    • Dec
    • Yoshimura, I., Y. Sato, Safety Achieved by the Safe Failure Fraction (SFF) in IEC61508, IEEE Trans.on Reliab., Vol. 57, No. 4, pp.662-669, Dec. 2008.
    • (2008) IEEE Trans.on Reliab , vol.57 , Issue.4 , pp. 662-669
    • Yoshimura, I.1    Sato, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.