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Volumn 324, Issue , 2011, Pages 277-281

High frequency ultrasound, a tool for elastic properties measurement of thin films fabricated on silicon

Author keywords

High frequency transducers; Ultrasonic characterization; Ultrasound

Indexed keywords

DIELECTRIC PERMITTIVITIES; ELASTIC PROPERTIES; EMBEDDED PARTICLES; FREQUENCY RANGES; HIGH FREQUENCY; HIGH FREQUENCY ACOUSTICS; HIGH FREQUENCY MEASUREMENTS; HIGH FREQUENCY TRANSDUCERS; HIGH FREQUENCY ULTRASOUNDS; INVERSION METHODS; LONGITUDINAL WAVES; MECHANICAL IMPEDANCES; METALLIC LAYERS; PARAMETER MEASUREMENT; SILICON SUBSTRATES; SPUTTERING TECHNOLOGY; THIN FILM MATERIAL; THIN LAYERS; ULTRASONIC CHARACTERIZATION; ZNO TRANSDUCERS;

EID: 80053000094     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMR.324.277     Document Type: Conference Paper
Times cited : (10)

References (4)
  • 1
    • 36749112637 scopus 로고
    • Acoustic microscope-scanning version
    • Lemons, R. A., and Quate, C. F., "Acoustic microscope-scanning version, " Appl. Phys. Lett., vol. 24, pp. 163-165, 1974
    • (1974) Appl. Phys. Lett. , vol.24 , pp. 163-165
    • Lemons, R.A.1    Quate, C.F.2
  • 3
    • 0036310024 scopus 로고    scopus 로고
    • Electrical characterization of plate piezoelectric transducers bonded to a finite substrate
    • DOI 10.1121/1.1416904
    • Y. Deblock, P. Campistron, M. Lippert, and C. Bruneel, Electrical characterization of plate piezoelectric transducers bonded to a finite substrate, J. Acoust. Soc. Am. 111 (6), 2681-2685, 2002 (Pubitemid 34760254)
    • (2002) Journal of the Acoustical Society of America , vol.111 , Issue.6 , pp. 2681-2685
    • Deblock, Y.1    Campistron, P.2    Lippert, M.3    Bruneel, C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.