Pyroelectric current measurements on PbZr0.2Ti 0.8O3 epitaxial layers

Journal of Applied Physics

Volumn 112, Issue 10, 2012, Pages

  Bhatia, B ^a   Karthik, J ^a   Tong, T ^a   Cahill, David G ^a   Martin, L W ^a   King, W P ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM TEMPERATURE; FREQUENCY DOMAINS; FREQUENCY RANGES; HOT PLATES; MICROFABRICATED; MODULATED LASERS; PYROELECTRIC COEFFICIENTS; PYROELECTRIC CURRENT; PZT; PZT FILM; TEMPERATURE CHANGES; THERMAL MEASUREMENTS;

ELECTRIC CURRENT MEASUREMENT; EPITAXIAL FILMS; MICROELECTRODES;

EPITAXIAL GROWTH;

EID: 84870663924     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4766271     Document Type: Article

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