Ion-beam etched PLZT samples and analysis by means of the surface laser intensity modulation method (SLIMM)

Ferroelectrics

Volumn 186, Issue 1-4, 1996, Pages 53-56

  Lang, Sidney B ^a,c   Jiang, Qiyue ^b  

^a RMIT UNIVERSITY   (Australia)

^b TEKTRONIX INC   (United States)

^c BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON ION BEAM BOMBARDMENT; LEAD ZIRCONATE TITANATE; PYROELECTRIC COEFFICIENT; SPONTANEOUS POLARIZATION; SURFACE LASER INTENSITY MODULATION METHOD;

ANNEALING; DIELECTRIC PROPERTIES; ION BOMBARDMENT; LASER APPLICATIONS; PERMITTIVITY; POLARIZATION; PYROELECTRICITY; REACTIVE ION ETCHING; SURFACE TREATMENT;

LEAD COMPOUNDS;

EID: 0030357390     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199608218031     Document Type: Article

References (6)

1. Q.Y. Jiang, S.B. Krupanidhi and L.E. Cross, ISAF7, Urbana, IL (June 1990).
2. S.B. Lang, Ferroelectrics, 118, 343 (1991).
3. B. Ploss, R. Emmerich and S. Bauer, J. Appl. Phys., 72, 5363 (1992).
4. S.B. Lang, To be published.
5. S.W. Provencher, Comput. Phys. Commun., 27, 213 (1982).
6. S.W. Provencher, Comput. Phys. Commun., 27, 229 (1982).