Fabrication of samples for scanning probe experiments on quantum spin Hall effect in HgTe quantum wells

Journal of Applied Physics

Volumn 112, Issue 10, 2012, Pages

  Baenninger, M ^a   Konig M ^a   Garcia, A G F ^a   Muhlbauer M ^b   Ames, C ^b   Leubner, P ^b   Brune C ^b   Buhmann, H ^b   Molenkamp, L W ^b   Goldhaber Gordon, D ^a  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACK-GATE; FABRICATION PROCESS; GATE ELECTRODES; P-TYPE; QUANTUM SPIN HALL EFFECT; QUANTUM SPIN HALLS; SCANNING PROBES;

CRYSTAL SYMMETRY; SPIN HALL EFFECT;

SEMICONDUCTOR QUANTUM WELLS;

EID: 84870656193     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4767362     Document Type: Article

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