Solution processable carbon nanotube network thin-film transistors operated in electrolytic solutions at various pH

Applied Physics Letters

Volumn 101, Issue 22, 2012, Pages

  Haeberle, Tobias ^a   Münzer, Alexandra M ^a   Buth, Felix ^b   Antonio Garrido, Jose ^b   Abdellah, Alaa ^a   Fabel, Bernhard ^a   Lugli, Paolo ^a   Scarpa, Giuseppe ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; CARBON NANOTUBE NETWORK; ELECTROLYTIC SOLUTION; GATE POTENTIALS; PH SENSITIVITY; RANDOMLY DISTRIBUTED; REFERENCE ELECTRODES; SEMI-CONDUCTING NANOTUBES; SINGLE-WALLED; SOLUTION PROCESSABLE; SURFACE CHARGING; TRANSFER CHARACTERISTICS; VARIOUS PH;

ELECTROLYTIC ANALYSIS; ELECTRONIC PROPERTIES; IONIC STRENGTH; THIN FILM TRANSISTORS;

CARBON NANOTUBES;

EID: 84870548766     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4768683     Document Type: Article

References (26)

1. M. Berggren and A. Richter-Dahlfors, Adv. Mater. 19, 3201 (2007). 10.1002/adma.200700419
2. S. M. Goetz, C. M. Erlen, H. Grothe, B. Wolf, P. Lugli, and G. Scarpa, Org. Electron. 10, 573 (2009). 10.1016/j.orgel.2009.02.011
3. R. M. Owens and G. G. Malliaras, MRS Bull. 35, 449 (2010). 10.1557/mrs2010.583
4. P. Lin and F. Yan, Adv. Mater. 24, 34 (2012). 10.1002/adma.201103334
5. M. D. Angione, R. Pilolli, S. Cotrone, M. Magliulo, A. Mallardi, G. Palazzo, L. Sabbatini, D. Fine, A. Dodabalapur, N. Cioffi, and L. Torsi, Mater. Today 14, 424 (2011). 10.1016/S1369-7021(11)70187-0
6. A. Star, T.-R. Han, J. -C. P. Gabriel, K. Bradley, and G. Grüner, Nano Lett. 3, 1421 (2003). 10.1021/nl0346833
7. K. Besteman, J.-O. Lee, F. G. M. Wiertz, H. A. Heering, and C. Dekker, Nano Lett. 3, 727 (2003). 10.1021/nl034139u
8. S. Rosenblatt, Y. Yaish, J. Park, J. Gore, V. Sazonova, and P. L. McEuen, Nano Lett. 2, 869 (2002). 10.1021/nl025639a
9. I. Heller, A. M. Janssens, J. Männik, E. D. Minot, S. G. Lemay, and C. Dekker, Nano Lett. 8, 591 (2008). 10.1021/nl072996i
10. B. L. Allen, P. D. Kichambare, and A. Star, Adv. Mater. 19, 1439 (2007). 10.1002/adma.200602043
11. E. S. Snow, J. P. Novak, P. M. Campbell, and D. Park, Appl. Phys. Lett. 82, 2145 (2003). 10.1063/1.1564291
12. E. S. Snow, P. M. Campbell, M. G. Ancona, and J.P. Novak, Appl. Phys. Lett. 86, 033105 (2005). 10.1063/1.1854721
13. P. Hu, J. Zhang, Z. Wen, and C. Zhang, Nanotechnology 22, 335502 (2011). 10.1088/0957-4484/22/33/335502
14. J. N. Tey, I. P. M. Wijaya, Z. Wang, W. H. Goh, A. Palaniappan, S. G. Mhaisalkar, I. Rodriguez, S. Dunham, and J. A. Rogers, Appl. Phys. Lett. 94, 013107 (2009). 10.1063/1.3065480
15. J. P. Kim, B. Y. Lee, S. Hong, and S. J. Sim, Anal. Biochem. 381, 193 (2008). 10.1016/j.ab.2008.06.040
16. D. R. Kauffman and A. Star, Chem. Soc. Rev. 37, 1197 (2008). 10.1039/b709567h
17. Z. Sun, V. Nicolosi, D. Rickard, S. D. Bergin, D. Aherne, and J. N. Coleman, J. Phys. Chem. C 112, 10692 (2008). 10.1021/jp8021634
18. T. Takahashi, K. Tsunoda, H. Yajima, and T. Ishii, Jpn. J. Appl. Phys., Part 1 43, 3636 (2004). 10.1143/JJAP.43.3636
19. R. C. Tenent, T. M. Barnes, J. D. Bergeson, A. J. Ferguson, B. To, L. M. Gedvilas, M. J. Heben, and J. L. Blackburn, Adv. Mater. 21, 3210 (2009). 10.1002/adma.200803551
20. A. Abdellah, A. Yaqub, C. Ferrari, B. Fabel, P. Lugli, and G. Scarpa, in 11th IEEE Conference on Nanotechnology (IEEE-NANO) (2011), p. 1118.
21. J. H. Back and M. Shim, J. Phys. Chem. B 110, 23736 (2006). 10.1021/jp063260x
22. I. Heller, S. Chatoor, J. Männik, M. A. G. Zevenbergen, C. Dekker, and S. G. Lemay, J. Am. Chem. Soc. 132, 17149 (2010). 10.1021/ja104850n
23. D. Landheer, G. Aers, W. R. McKinnon, M. J. Deen, and J. C. Ranuarez, J. Appl. Phys. 98, 044701 (2005). 10.1063/1.2008354
24. D. E. Yates, S. Levine, and T. W. Healy, J. Chem. Soc., Faraday Trans. 1 70, 1807 (1974). 10.1039/f19747001807
25. A. J. Bard and L. R. Faulkner, Electrochemical Methods: Fundamentals and Applications (Wiley, New York, 2001).
26. See supplementary material at http://dx.doi.org/10.1063/1.4768683 E-APPLAB-101-002249 for details on the sample fabrication methods and morphological characterization of the CNT thin-film.