Atomic and electronic structure of ultrathin Bi(111) films grown on Bi 2Te3(111) substrates: Evidence for a strain-induced topological phase transition

Physical Review Letters

Volumn 109, Issue 22, 2012, Pages

  Hirahara, T ^a   Fukui, N ^a   Shirasawa, T ^a   Yamada, M ^a   Aitani, M ^a   Miyazaki, H ^b   Matsunami, M ^b   Kimura, S ^b   Takahashi, T ^a   Hasegawa, S ^a   Kobayashi, K ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^c OCHANOMIZU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-RESOLVED PHOTOEMISSION; BI FILMS; FIRST-PRINCIPLES CALCULATION; THREE DIMENSIONS; TOPOLOGICAL INVARIANTS; TOPOLOGICAL PHASE; ULTRA-THIN;

CALCULATIONS; ELECTRONIC STRUCTURE; ELECTRONS; LOW ENERGY ELECTRON DIFFRACTION; SUBSTRATES; TOPOLOGY; ULTRATHIN FILMS;

BISMUTH;

EID: 84870449723     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.227401     Document Type: Article

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