SCOPUS 정보 검색 플랫폼

Optics Letters

Volumn 37, Issue 23, 2012, Pages 5012-5014

Ultraprecise measurement of resonance shift for sensing applications

(3) Qiu, Ciyuan a Chen, Jianbo a Xu, Qianfan a

a Rice University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHANGE OF REFRACTIVE INDEX; MICRORING RESONATOR; P-I-N JUNCTIONS; QUALITY FACTORS; RESONANCE MEASUREMENT; RESONANCE SHIFT; RESONANT WAVELENGTHS; SENSING APPLICATIONS; TUNABLE RESONATORS; ULTRAHIGH PRECISION;

REFRACTIVE INDEX; RESONATORS; WAVELENGTH;

RESONANCE;

SILICON;

ARTICLE; CHEMISTRY; LIGHT RELATED PHENOMENA; OPTICAL INSTRUMENTATION;

OPTICAL DEVICES; OPTICAL PROCESSES; SILICON;

EID: 84870401379 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.37.005012 Document Type: Article

Times cited : (24)

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