BIPM direct on-site Josephson voltage standard comparisons: 20 years of results

Measurement Science and Technology

Volumn 23, Issue 12, 2012, Pages

  Solve, Stephane ^a   Stock, Michael ^a  

^a PAVILLON DE BRETEUIL   (France)

Author keywords

comparison; Josephson voltage standard; primary standard; SI

Indexed keywords

SILICON; UNCERTAINTY ANALYSIS; VOLTAGE MEASUREMENT;

BUREAU INTERNATIONAL DES POIDS ET MESURES; COMPARISON; INSULATION RESISTANCE; JOSEPHSON VOLTAGE STANDARDS; MICROWAVE DISTRIBUTIONS; MUTUAL RECOGNITION ARRANGEMENTS; NATIONAL METROLOGY INSTITUTES; PRIMARY STANDARDS;

JOSEPHSON JUNCTION DEVICES;

EID: 84870334093     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/23/12/124001     Document Type: Review

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