Experience with high-output-resistance MJTC AC-DC transfer standards at high frequencies

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 4, 2003, Pages 1314-1319

  Filipski, Piotr S ^a   Boecker, Michael ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

AC DC transfer standard; Calibration; Electric variables measurement; Measurement standard; Multijunction thin film thermal converter; Nanovoltmeter; Thermal converter

Indexed keywords

COMPARATOR CIRCUITS; ELECTRIC CONDUCTIVITY; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; HEATING EQUIPMENT; MEASUREMENT ERRORS; SILICON WAFERS; THERMAL INSULATION; THERMOPILES; THIN FILMS; VOLTMETERS;

AC-DC TRANSFER STANDARD; MULTIJUNCTION THERMAL CONVERTERS; NANOVOLTMETER;

THERMOELECTRIC EQUIPMENT;

EID: 0141919641     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.816852     Document Type: Article

References (11)

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