-
1
-
-
46549090031
-
Epoxy encapsulant as serendipitous dosimeters during radiological/nuclear events
-
J.H. Barkyoumb, and V.K. Mathur Epoxy encapsulant as serendipitous dosimeters during radiological/nuclear events Radiat. Meas. 43 2008 841 844
-
(2008)
Radiat. Meas.
, vol.43
, pp. 841-844
-
-
Barkyoumb, J.H.1
Mathur, V.K.2
-
2
-
-
77954733179
-
Photon energy dependence of three fortuitous dosimeters from personal electronic devices, measured by optically stimulated luminescence
-
K. Beerten, and F. Vanhavere Photon energy dependence of three fortuitous dosimeters from personal electronic devices, measured by optically stimulated luminescence Radiat. Prot. Dosim. 140 2010 294 299
-
(2010)
Radiat. Prot. Dosim.
, vol.140
, pp. 294-299
-
-
Beerten, K.1
Vanhavere, F.2
-
3
-
-
70249145471
-
Thermoluminescence dosimetry of electronic components from personal objects
-
K. Beerten, C. Woda, and F. Vanhavere Thermoluminescence dosimetry of electronic components from personal objects Radiat. Meas. 44 2009 620 625
-
(2009)
Radiat. Meas.
, vol.44
, pp. 620-625
-
-
Beerten, K.1
Woda, C.2
Vanhavere, F.3
-
4
-
-
84862888518
-
Retrospective dosimetry with alumina substrate from electronic components
-
D. Eckendahl, and L. Judas Retrospective dosimetry with alumina substrate from electronic components Radiat. Prot. Dosim. 150 2012 134 141
-
(2012)
Radiat. Prot. Dosim.
, vol.150
, pp. 134-141
-
-
Eckendahl, D.1
Judas, L.2
-
6
-
-
18244414634
-
Telephone chip cards as individual dosimeters
-
H.Y. Göksu Telephone chip cards as individual dosimeters Radiat. Meas. 37 2003 617 620
-
(2003)
Radiat. Meas.
, vol.37
, pp. 617-620
-
-
Göksu, H.Y.1
-
7
-
-
45249117719
-
Optically stimulated luminescence of electronic components for forensic, retrospective and accident dosimetry
-
E.L. Inrig, D.I. Godfrey-Smith, and S. Khanna Optically stimulated luminescence of electronic components for forensic, retrospective and accident dosimetry Radiat. Meas. 43 2008 726 730
-
(2008)
Radiat. Meas.
, vol.43
, pp. 726-730
-
-
Inrig, E.L.1
Godfrey-Smith, D.I.2
Khanna, S.3
-
8
-
-
77955306466
-
Fading corrections to electronic substrates in retrospective accident dosimetry
-
E.L. Inrig, D.I. Godfrey-Smith, and C.L. Larsson Fading corrections to electronic substrates in retrospective accident dosimetry Radiat. Meas. 45 2010 608 610
-
(2010)
Radiat. Meas.
, vol.45
, pp. 608-610
-
-
Inrig, E.L.1
Godfrey-Smith, D.I.2
Larsson, C.L.3
-
10
-
-
0242434366
-
Origin of the exponential distribution of traps in glass
-
T. Sakurai, K. Shoji, K. Itoh, and R.K. Gartia Origin of the exponential distribution of traps in glass J. Appl. Phys. 89 2001 2208 2212
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 2208-2212
-
-
Sakurai, T.1
Shoji, K.2
Itoh, K.3
Gartia, R.K.4
-
11
-
-
4344702191
-
The trap parameters of electrons in intermediate energy levels in quartz
-
I. Veronese, A. Giussani, H.Y. Göksu, and M. Martini The trap parameters of electrons in intermediate energy levels in quartz Radiat. Meas. 38 2004 743 746
-
(2004)
Radiat. Meas.
, vol.38
, pp. 743-746
-
-
Veronese, I.1
Giussani, A.2
Göksu, H.Y.3
Martini, M.4
-
12
-
-
84984446180
-
Thermal quenching of thermoluminescence in quartz
-
A.G. Wintle Thermal quenching of thermoluminescence in quartz Geophys. J. R. Astron. Soc. 41 1975 107 113
-
(1975)
Geophys. J. R. Astron. Soc.
, vol.41
, pp. 107-113
-
-
Wintle, A.G.1
-
13
-
-
70249148024
-
On the use of OSL of wire-bond chip card modules for retrospective and accident dosimetry
-
C. Woda, and T. Spöttl On the use of OSL of wire-bond chip card modules for retrospective and accident dosimetry Radiat. Meas. 44 2009 548 553
-
(2009)
Radiat. Meas.
, vol.44
, pp. 548-553
-
-
Woda, C.1
Spöttl, T.2
-
14
-
-
77955307333
-
On the OSL curve shape and preheat treatment of electronic components from portable electronic devices
-
C. Woda, K. Beerten, and S. Greilich On the OSL curve shape and preheat treatment of electronic components from portable electronic devices Radiat. Meas. 45 2010 746 748
-
(2010)
Radiat. Meas.
, vol.45
, pp. 746-748
-
-
Woda, C.1
Beerten, K.2
Greilich, S.3
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