Fading corrections to electronic component substrates in retrospective accident dosimetry

Radiation Measurements

Volumn 45, Issue 3-6, 2010, Pages 608-610

  Inrig, E L ^a   Godfrey Smith, D I ^a   Larsson, C L ^a  

^a DEFENCE RESEARCH AND DEVELOPMENT CANADA   (Canada)

Author keywords

Accident dosimetry; Alumina ceramics; Anomalous fading; Electronics; OSL; Retrospective dosimetry

Indexed keywords

ACCIDENT DOSIMETRY; ALUMINA CERAMIC; ELECTRONIC COMPONENT; ELECTRONIC DEVICE; ENCAPSULANTS; GENERAL POPULATION; HIGH DOSE; LOW TEMPERATURES; MAXIMUM SENSITIVITY; MINIMAL EFFECTS; PREHEAT TEMPERATURE; RADIATION DOSE; RADIATION-INDUCED LUMINESCENCE; RAPID ASSESSMENT; RETROSPECTIVE DOSIMETRY; SIGNAL FADING;

ACCIDENTS; ALUMINUM NITRIDE; CERAMIC MATERIALS; NITRIDES; PREHEATING; RESISTORS; SILICON CARBIDE;

DOSIMETRY;

EID: 77955306466     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2009.12.032     Document Type: Conference Paper

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