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Volumn 86, Issue 19, 2012, Pages

Quantitative theory of the oxygen vacancy and carrier self-trapping in bulk TiO 2

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EID: 84870170475     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.195206     Document Type: Article
Times cited : (183)

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