Spectroscopic ellipsometry study on the optical dielectric properties of silver platinum alloy thin films

Journal of Alloys and Compounds

Volumn 551, Issue , 2013, Pages 352-359

  Yang, Guang ^a   Fu, Xiao Jian ^a   Sun, Jing Bo ^a   Zhou, Ji ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Dielectric functions; Joint density of states function; Magnetron sputtering; Silver platinum alloy films; Variable angle spectroscopic ellipsometry

Indexed keywords

ALLOY FILM; AS-DEPOSITED ALLOY; DATA SIMULATION; DIELECTRIC FUNCTIONS; DIELECTRIC PERMITTIVITIES; DIRECT CURRENT MAGNETRON SPUTTERING; EFFECTIVE MEDIUM THEORIES; GRAIN SIZE; IMAGINARY PARTS; INTER-BAND TRANSITION; JOINT DENSITY OF STATE; PLASMONICS; PLATINUM CONCENTRATION; PT ALLOY; SILICON SUBSTRATES; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

DEPOSITS; MAGNETRON SPUTTERING; METALLIC FILMS; METAMATERIALS; OPTICAL PROPERTIES; PERMITTIVITY; PLATINUM; SILVER; SILVER ALLOYS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS; X RAY DIFFRACTION;

PLATINUM ALLOYS;

EID: 84869868899     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.10.033     Document Type: Article

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