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Thin Solid Films

Volumn 388, Issue 1-2, 2001, Pages 237-244

Optical, electrical and structural properties of Al-Ti and Al-Cr thin films

(5) Wöltgens, Han Willem a,b Friedrich, Inés a,b Njoroge, Walter K a Theiß, Wolfgang c Wuttig, Matthias a,b

a RWTH AACHEN UNIVERSITY (Germany)

b FORSCHUNGSZENTRUM JÜLICH (Germany)

c M Theiss Hard and Software (Germany)

Author keywords

Alloys; Aluminium; Electrical properties and measurements; Optical properties

Indexed keywords

ALUMINUM ALLOYS; ANNEALING; ATOMIC FORCE MICROSCOPY; BINARY ALLOYS; COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; LIGHT REFLECTION; OPTICAL FILMS; OPTICAL PROPERTIES; PHASE SEPARATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THERMAL CONDUCTIVITY OF SOLIDS; THERMODYNAMIC STABILITY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

OPTICAL SPECTROSCOPY; VAN DER PAUW METHOD; X RAY REFLECTOMETRY;

METALLIC FILMS;

EID: 0035372129 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)00807-0 Document Type: Article

Times cited : (18)

References (19)

1
- 0003869257
- Butterworth, London
- (1976) Aluminium Alloys: Structure and Properties
- Mondolfo, L.F.¹

2
- 0001552013
- (1990) Rev. Int. Hautes Temper. Refract. , vol.26 , pp. 181
- Auchet, J.¹ Bretonet, J.L.²

3
- 0002425321
- (1958) Philips Research Report , vol.13 , pp. 1
- Van der Pauw, L.J.¹

4
- 0005330995
- (1959) Philips Tech. Rev. , vol.20 , pp. 278
- Van der Pauw, L.J.¹

5
- 0005284210
- Springer Verlag
- (1971) Reine und angewandte Metallkunde in Einzeldarstellung , vol.22
- Hummel, R.E.¹

6
- 84940858493
- E. Palik (Ed.), Academic Press Inc
- (1985) Handbook of Optical Constants of Solids , pp. 369-406
- Smith, D.Y.¹

7
- 0005326258
- K. Vedam (Ed.), Academic Press
- (1994) Optical Characterization of Real Surfaces and Films , pp. 127-189
- Nguyen, H.V.¹ An, I.² Collins, R.W.³

8
- 4243378518
- (1997) Surface Science Reports, Optical Properties of Porous Silicon , vol.29 , Issue.3-4
- Theiß, W.¹

9
- 0005292058
- (1995) Appl. Phys. Lett. , vol.66 , pp. 10
- Gladkikh, A.¹ Lereah, Y.² Glickman, E.³ Karpovski, M.⁴ Palevski, A.⁵ Schubert, J.⁶

10
- 0005284211
- (1988) J. Appl. Phys. , vol.64 , pp. 11
- Bacconier, B.¹ Lormand, G.² Papapietro, M.³ Papon, A.-M.⁴

11
- 0005240535
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 1
- Ericson, F.¹ Kristensen, N.² Schweitz, J.³ Smith, U.⁴

12
- 0005239891
- (1993) J. Appl. Phys. , vol.73 , pp. 12
- Niwa, H.¹ Yamaguchi, I.² Yagi, H.³ Nakahar, K.⁴ Kato, M.⁵

13
- 0005239697
- (1991) J. Vac. Sci. Technol. A , vol.9 , pp. 4
- Smith, U.¹ Kristensen, N.² Ericson, F.³ Schweitz, J.⁴

14
- 0005327746
- (1996) J. Appl. Phys. , vol.79 , pp. 7
- Génin, F.Y.¹ Siekhaus, W.²

15
- 0005283214
- Dr.-Bernhard-Klein-Str. 110, D-52078 Aachen, Germany
- Hard- and Software
- Theiss, M.¹

16
- 0005283215
- (1978) Phys. Rep. C , vol.43
- Bergman, D.¹

17
- 0002150152
- Academic Press, San Diego
- (1992) Solid State Physics , vol.46 , pp. 148
- Bergman, D.J.¹ Stroud, D.²

18
- 0001586055
- R. Helbig (Ed.), Vieweg, Braunschweig, Wiesbaden
- (1994) Festkörperprobleme, Advances in Solid State Physics , vol.33 , pp. 149-176
- Theiß, W.¹

19
- 0000673631
- (1994) Z. Metallkd. , vol.85 , pp. 855
- Braun, J.¹ Ellner, M.² Predel, B.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.