SCOPUS 정보 검색 플랫폼

Soft Matter

Volumn 8, Issue 27, 2012, Pages 7108-7111

A direct observation of nanometer-size void dynamics in an ultra-thin water film

(3) Mirsaidov, Utkur a,b Ohl, Claus Dieter c Matsudaira, Paul a,b

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

b NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

c NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL DIAMETER; DIRECT DYNAMICS; EXPERIMENTAL OBSERVATION; GROWTH DYNAMICS; HYDROPHILIC SUBSTRATE; IN-SITU TEM; INDUCED NUCLEATION; MINIMIZATION OF FREE ENERGY; MODEL-BASED OPC; NANO-VOIDS; NANOMETER SIZE; THIN WATER FILMS; ULTRA-THIN; VOID DYNAMICS; WATER FILM;

COALESCENCE; ELECTRON BEAMS;

DYNAMICS;

EID: 84869594645 PISSN: 1744683X EISSN: 17446848 Source Type: Journal
DOI: 10.1039/c2sm25331c Document Type: Article

Times cited : (33)

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