Coupled modeling of evolution of impurity/defect distribution and cell performance

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 217-220

  Tryznadlowski, Bart ^a   Yazdani, Armin ^a   Chen, Renyu ^a   Dunham, Scott T ^a  

^a University of Washington   (United States)

Author keywords

charge carrier lifetime; gettering; photovoltaic cells; semiconductor device modeling; semiconductor process modeling

Indexed keywords

ACTIVE DEFECTS; BACK SURFACE FIELDS; CELL PERFORMANCE; CONTINUUM MODEL; COUPLED MODELING; DEFECT DISTRIBUTION; DEVICE PERFORMANCE; DEVICE SIMULATIONS; GETTERING; LIGHT ELEMENTS; MODELING RESULTS; PREDICTIVE MODELING; SEMICONDUCTOR PROCESS MODELING; SOLAR CELL FABRICATION PROCESS; SOLID SOURCES; TRAP LEVELS;

CHARGE CARRIERS; CHEMICAL ELEMENTS; CONTINUUM MECHANICS; DOPING (ADDITIVES); OPTIMIZATION; PHOSPHORUS; PHOTOVOLTAIC CELLS; POINT DEFECTS; SEMICONDUCTOR DEVICE MODELS;

BORON;

EID: 84869439065     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317604     Document Type: Conference Paper

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