Effect of annealing atmosphere and temperature on the properties of Cd 2SnO4 thin films

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 1803-1806

  Meng, Tiejun ^a   McCandless, Brian E ^a   Buchanan, Wayne A ^a   Birkmire, Robert W ^a   Hamilton, Charles T ^b   Aitken, Bruce G ^b   Williams, Carlo A Kosik ^b  

^a UNIVERSITY OF DELAWARE   (United States)

^b Corning Incorporated ^*  (United States)

Author keywords

annealing; cadmium compound; conductive films

Indexed keywords

ANNEALING ATMOSPHERES; ANNEALING TEMPERATURES; CADMIUM STANNATE; LOW RESISTIVITY; MOSS-BURSTEIN SHIFT; RADIO FREQUENCY MAGNETRON SPUTTERING; SINGLE PHASE;

ATMOSPHERIC PRESSURE; CADMIUM; CADMIUM COMPOUNDS; CARRIER CONCENTRATION; CONDUCTIVE FILMS; ELECTRON MOBILITY; MAGNETRON SPUTTERING; THIN FILMS;

ANNEALING;

EID: 84869402434     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317943     Document Type: Conference Paper

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