Structural, optical and electrical properties of In-doped Cd 2SnO4 thin films by spray pyrolysis method

Journal of Alloys and Compounds

Volumn 509, Issue 12, 2011, Pages 4390-4393

  Kumaravel, R ^a   Ramamurthi, K ^a  

^a BHARATHIDASAN UNIVERSITY   (India)

Author keywords

Conductivity; Optical properties; Semiconductors; X ray diffraction

Indexed keywords

CONDUCTIVITY; CUBIC CRYSTAL STRUCTURES; DOPING CONCENTRATION; EFFECT OF IN; HALL MEASUREMENTS; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL TRANSMITTANCE; OPTICAL TRANSPARENCY; POLYCRYSTALLINE; SEMICONDUCTORS; SPRAY PYROLYSIS METHOD; SUBSTRATE TEMPERATURE; VISIBLE RANGE; X-RAY DIFFRACTION STUDIES;

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CRYSTAL ATOMIC STRUCTURE; DIFFRACTION; ELECTRIC PROPERTIES; INDIUM; OPACITY; SEMICONDUCTOR DOPING; SPRAY PYROLYSIS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

OPTICAL FILMS;

EID: 79952191037     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2011.01.039     Document Type: Article

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