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Volumn , Issue , 2012, Pages
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A 123μW standby power technique with EM-tolerant 1.8V I/O NMOS power switch in 28nm HKMG technology
a a a a a a a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVE LEAKAGE;
CHANNEL UTILIZATION;
CONVENTIONAL TECHNIQUES;
CPU CORES;
FULL-CORE;
LEAKAGE POWER;
MAGNITUDE REDUCTION;
MOBILE PROCESSORS;
OPERATION MODE;
POWER SWITCHES;
POWER-GATING;
STANDBY POWER;
INTEGRATED CIRCUITS;
LEAKAGE CURRENTS;
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EID: 84869396390
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CICC.2012.6330708 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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