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Volumn 51, Issue 10 PART 2, 2012, Pages

Optimization of gas-switching sequence for InGaAs/GaAsP superlattice structures using in situ wafer curvature monitoring

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE STRAIN; CURVATURE MEASUREMENT; GAAS; HIGH-ACCURACY; HYDROGEN PURGE; INSERTION LAYERS; METAL-ORGANIC VAPOR PHASE EPITAXY; SUPER-LATTICE STRUCTURES; SURFACE ATOMS; WAFER CURVATURE;

EID: 84869104855     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.51.10ND09     Document Type: Article
Times cited : (11)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.