Broadband dielectric characterization of TiO 2 ceramics sintered through microwave and conventional processes

Ceramics International

Volumn 39, Issue 1, 2013, Pages 299-306

  Marinel, Sylvain ^a,b   Choi, Doo Hyun ^a   Heuguet, Romain ^b   Agrawal, Dinesh ^a   Lanagan, Michael ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b LABORATOIRE CRISMAT   (France)

Author keywords

Dielectric properties; Microwave processing; TiO 2

Indexed keywords

COMPARISON ANALYSIS; CONVENTIONAL FURNACE; DENSE MATERIALS; DIELECTRIC CHARACTERIZATION; FREQUENCY RANGES; GRAIN SIZE; MICROWAVE PROCESSING; MICROWAVE SINTERING; PROCESSING TEMPERATURE; Q-FACTORS; RUTILE TIO; SINGLE MODE CAVITY; SINTERED SAMPLES; SINTERED SPECIMEN; SINTERING CONDITION; SINTERING CYCLES; SINTERING TEMPERATURES; SUBMICRON; SUSCEPTORS; THEORETICAL DENSITY; TIO;

CERAMIC MATERIALS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; MICROWAVE HEATING; MICROWAVES; OXIDE MINERALS; PROCESSING; TITANIUM DIOXIDE;

SINTERING;

EID: 84869091792     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2012.06.025     Document Type: Article

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