Processing and dielectric properties of TiO2 Thick films for high-energy density capacitor applications

International Journal of Applied Ceramic Technology

Volumn 8, Issue 6, 2011, Pages 1363-1373

  Chao, Sheng ^a   Dogan, Fatih ^a  

^a University of Missouri Rolla   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC BREAKDOWN STRENGTH; DISPERSABILITY; DISPERSANTS; ENERGY DENSITY; GREEN TAPE; HIGH-ENERGY DENSITIES; LOSS FACTOR; MICROSTRUCTURAL DEVELOPMENT; NANO-SIZED TITANIUM DIOXIDE; RHEOLOGY MEASUREMENT; SINTERED DENSITY; TAPE CASTING; TIO;

DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; FILM PREPARATION; SINTERING; THICK FILMS; TITANIUM; TITANIUM CASTINGS;

TITANIUM DIOXIDE;

EID: 80755169407     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2010.02592.x     Document Type: Article

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