On the role of fresnel factors in sum-frequency generation spectroscopy of metal-water and metal-oxide-water interfaces

Journal of Physical Chemistry C

Volumn 116, Issue 44, 2012, Pages 23351-23361

  Backus, Ellen H G ^a,b   Garcia Araez, Nuria ^a   Bonn, Mischa ^a,b   Bakker, Huib J ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLES OF INCIDENCE; BULK WATER; EXPERIMENTAL CONDITIONS; FREQUENCY-DEPENDENT; FRESNEL; INFRARED BEAMS; INFRARED FIELD; INFRARED FREQUENCIES; INTERFACIAL WATER; INTERFACIAL WATER STRUCTURE; INTERNAL REFLECTIONS; LIQUID INTERFACE; METAL OXIDE FILM; NONRESONANT; PRACTICAL RECOMMENDATION; SPECTRAL DEPENDENCES; SPECTROSCOPIC MEASUREMENTS; STRONG ENHANCEMENT; SUM-FREQUENCY GENERATION; SUM-FREQUENCY GENERATION SPECTROSCOPY; THIN METALS;

ELECTRIC FIELDS; INTERFEROMETRY; LIQUIDS; METALS; OXIDE FILMS; REFRACTIVE INDEX;

PHASE INTERFACES;

EID: 84868703500     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp306273d     Document Type: Article

References (46)

1. Shen, Y. R. Nature 1989, 337, 519-525
2. Eisenthal, K. B. Annu. Rev. Phys. Chem. 1992, 43, 627-661
3. Eisenthal, K. B. Chem. Rev. 1996, 96, 1343-1360
4. Shultz, M. J.; Schitzer, C.; Simonelli, D.; Baldelli, S. Int. Rev. Phys. Chem. 2000, 19, 123-153
5. Richmond, G. L. Annu. Rev. Phys. Chem. 2001, 52, 357-389
6. Richmond, G. L. Chem. Rev. 2002, 102, 2693-2724
7. Tadjeddine, A. Surf. Rev. Lett. 2000, 7, 423-436
8. Vidal, F.; Tadjeddine, A. Rep. Prog. Phys. 2005, 68, 1095-1127
9. Wang, H. F.; Gan, W.; Lu, R.; Rao, Y.; Wu, B. H. Int. Rev. Phys. Chem. 2005, 24, 191-256
10. Campen, R. K.; Ngo, T. T. M.; Sovago, M.; Ruysschaert, J. M.; Bonn, M. J. Am. Chem. Soc. 2010, 132, 8037-8047
11. Chen, Z.; Shen, Y. R.; Somorjai, G. A. Annu. Rev. Phys. Chem. 2002, 53, 437-465
12. Lambert, A. G.; Davies, P. B.; Neivandt, D. J. Appl. Spectrosc. Rev. 2005, 40, 103-145
13. Bredenbeck, J.; Ghosh, A.; Smits, M.; Bonn, M. J. Am. Chem. Soc. 2008, 130, 2152-2153
14. Bonn, M.; Bakker, H. J.; Gosh, A.; Yamamoto, S.; Sovago, M.; Campen, R. K. J. Am. Chem. Soc. 2010, 132, 14971-14978
15. Shen, Y. R.; Ostroverkhov, V. Chem. Rev. 2006, 106, 1140-1154
16. Stiopkin, I. V.; Weeraman, C.; Pieniazek, P. A.; Shalhout, F. Y.; Skinner, J. L.; Benderskii, A. V. Nature 2011, 474, 192-195
17. Arnolds, H.; Bonn, M. Surf. Sci. Rep. 2010, 65, 45-66
18. Himmelhaus, M.; Eisert, F.; Buck, M.; Grunze, M. J. Phys. Chem. B 2000, 104, 576-584
19. Braunschweig, B.; Mukherjee, P.; Kutz, R. B.; Wieckowski, A.; Dlott, D. D. J. Chem. Phys. 2010, 133, 234702
20. Backus, E. H. G.; Kuiper, J. M.; Engberts, J. B. F. N.; Poolman, B.; Bonn, M. J. Phys. Chem. B 2011, 115, 2294-2302
21. Feller, M. B.; Chen, W.; Shen, Y. R. Phys. Rev. A 1991, 43, 6778-6792
22. Feng, R. R.; Guo, Y.; Lü, R.; Velarde, L.; Wang, H. F. J. Phys. Chem. A 2011, 115, 6015-6027
23. Lambert, A. G.; Neivandt, D. J.; Briggs, A. M.; Usadi, E. W.; Davies, P. B. J. Phys. Chem. B 2002, 106, 5461-5469
24. Li, G.; Dhinojwala, A.; Yeganeh, M. S. J. Phys. Chem. C 2011, 115, 7554-7561
25. McGall, S. J.; Davies, P. B.; Neivandt, D. J. J. Phys. Chem. B 2004, 108, 16030-16039
26. Tong, Y.; Zhao, Y.; Li, N.; Osawa, M.; Davies, P. B.; Ye, S. J. Chem. Phys. 2010, 133, 034704
27. Tong, Y.; Zhao, Y.; Li, N.; Ma, Y.; Osawa, M.; Davies, P. B.; Ye, S. J. Chem. Phys. 2010, 133, 034705
28. York, R. L.; Li, Y.; Holinga, G. J.; Somorjai, G. A. J. Phys. Chem. A 2009, 113, 2768-2774
29. Zhuang, X.; Miranda, P. B.; Kim, D.; Shen, Y. R. Phys. Rev. B 1999, 59, 12632-12640
30. Lu, X.; Clarke, M. L.; Li, D.; Wang, X.; Xue, G.; Chen, Z. J. Phys. Chem. C 2011, 115, 13759-13767
31. Shen, Y. R. Annu. Rev. Phys. Chem. 1989, 40, 327-350
32. Mizrahi, V.; Sipe, J. E. J. Opt. Soc. Am. B 1988, 5, 660-667
33. Hansen, W. N. J. Opt. Soc. Am. 1968, 58, 380-390
34. Wang, F. X.; Rodríguez, F. J.; Albers, W. M.; Ahorinta, R.; Sipe, J. E.; Kauranen, M. Phys. Rev. B 2009, 80, 233402
35. Jackson, J. D. Classical Electrodynamics; John Wiley & Sons, Inc.: New York, 1999.
36. Osawa, M.; Kuramitsu, M.; Hatta, A.; Suetaka, W. Surf. Sci. 1986, 175, L787-L793
37. Verreault, D.; Kurz, V.; Howell, C.; Koelsch, P. Rev. Sci. Instrum. 2010, 81, 063111
38. Williams, C. T.; Yang, Y.; Bain, C. D. Langmuir 2000, 16, 2343-2350
39. Nihonyanagi, S.; Ye, S.; Uosaki, K.; Dreesen, L.; Humbert, C.; Thiry, P.; Peremans, A. Surf. Sci. 2004, 573, 11-16
40. Noguchi, H.; Okada, T.; Uosaki, K. Faraday Discuss. 2008, 140, 125-137
41. Lagutchev, A.; Hambir, S. A.; Dlott, D. D. J. Phys. Chem. C 2007, 111, 13645-13647
42. Palik, E. D. Handbook of optical constants of solids 1985.
43. Bertie, J. E.; Ahmed, M. K.; Eysel, H. H. J. Phys. Chem. 1989, 93, 2210-2218
44. Hale, G. M.; Querry, M. R. Appl. Opt. 1973, 12, 555-563
45. Hjortsberg, A.; Hamberg, I.; Granqvist, C. G. Thin Solid Films 1982, 90, 323-326
46. Ham, E. W. M. v. d.; Vrehen, Q. H. F.; Eliel, E. R.; Yakovlev, V. A.; Valieva, E. V.; Kuzik, L. A.; Petrov, J. E.; Sychugov, V. A.; Meer, A. F. G. v. d. J. Opt. Soc. Am. B 1999, 16, 1146-1152