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Volumn 81, Issue 6, 2010, Pages

Sample cells for probing solid/liquid interfaces with broadband sum-frequency-generation spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND CORRECTION; DATA ANALYSIS; METALLIC SURFACE; PULSE SHAPING METHOD; REAL TIME; REFERENCE BEAMS; SAMPLE CELL; SENSITIVITY TESTS; SOLID/LIQUID INTERFACES; SPECTROELECTROCHEMICAL CELLS; SUM FREQUENCY GENERATION; SUM-FREQUENCY-GENERATION SPECTROSCOPY; SURFACE COVERAGES; THIN LAYERS;

EID: 77954196317     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3443096     Document Type: Article
Times cited : (33)

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