Interference effects in the sum frequency generation spectra of thin organic films. I. Theoretical modeling and simulation

Journal of Chemical Physics

Volumn 133, Issue 3, 2010, Pages

  Tong, Yujin ^a   Zhao, Yanbao ^a   Li, Na ^a   Osawa, Masatoshi ^a   Davies, Paul B ^b   Ye, Shen ^a,c  

^a HOKKAIDO UNIVERSITY   (Japan)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LAYER; DIELECTRIC THIN FILMS; FILM INTERFACES; GENERAL METHOD; GOLD SUBSTRATES; INFRARED BEAMS; INTENSITY CHANGE; INTERFACIAL MOLECULES; INTERFERENCE EFFECTS; LOCAL-FIELD FACTORS; MODEL CALCULATIONS; NONLINEAR OPTICAL RESPONSE; NONLINEAR SUSCEPTIBILITIES; NONRESONANT; ORGANIC MONOLAYERS; PHASE DIFFERENCE; QUANTITATIVE REMOVAL; RELATIVE INTENSITY; RESONANT CONTRIBUTION; SPECTRAL INTENSITY; SPECTRAL SHAPES; SUM FREQUENCY; SUM FREQUENCY GENERATION; THEORETICAL CALCULATIONS; THEORETICAL MODELING; THIN ORGANIC FILMS; THREE-LAYER; TWO SOURCES; VARIABLE THICKNESS; ACTIVE INTERFACE; COPROPAGATING; COUNTER-PROPAGATING BEAM; DIELECTRIC SUBSTRATES; ELECTROCHEMICAL MEASUREMENTS; EXPERIMENTAL FACTORS; EXPERIMENTAL SPECTRA; IN-SITU; INCIDENT BEAMS; MOLECULAR ORIENTATIONAL; OPTICAL GEOMETRY; ORGANIC FILMS; REVERSE ORIENTATION; THICKNESS EFFECT; THIN LAYERS; THIN LIQUIDS; THIN-LAYER FILM; VIBRATIONAL MODES;

COMPUTER SIMULATION; DIELECTRIC DEVICES; DIELECTRIC FILMS; ELECTRIC FIELDS; MONOLAYERS; PHASE INTERFACES; THIN FILMS; VAPOR DEPOSITION; COMPUTATIONAL GEOMETRY; DIELECTRIC MATERIALS; GOLD; OPTICAL PROPERTIES;

FILM THICKNESS; SUBSTRATES;

EID: 77956252627     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3428668     Document Type: Article

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