Statistical analysis on the effect of calendering process parameters on the geometry and conductivity of printed patterns

Robotics and Computer-Integrated Manufacturing

Volumn 29, Issue 2, 2013, Pages 424-430

  Nguyen, Ho Anh Duc ^a   Hoang, Nguyen ^a   Shin, Kee Hyun ^a   Lee, Sangyoon ^a  

^a Konkuk University   (South Korea)

Author keywords

Calendering process; Conductivity; Gravure printing; Printed electronics; Roughness; Thickness

Indexed keywords

ANALYSIS OF VARIANCE METHOD; GRAVURE PRINTING; INFLUENTIAL FACTORS; INTERACTION EFFECT; MORPHOLOGICAL CHARACTERISTIC; PATTERN THICKNESS; PRINTED ELECTRONICS; PRINTED PATTERNS; PROCESS PARAMETERS; STATISTICAL TECHNIQUES; THICKNESS;

CALENDERING; CALENDERS; ELECTRIC CONDUCTIVITY; SURFACE ROUGHNESS;

PROCESS CONTROL;

EID: 84868526147     PISSN: 07365845     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.rcim.2012.09.012     Document Type: Article

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