Influence of microstructure and interfacial strain on the magnetic properties of epitaxial Mn 3O 4/La 0.7Sr 0.3MnO 3 layered-composite thin films

Journal of Applied Physics

Volumn 112, Issue 8, 2012, Pages

  Mukherjee, Devajyoti ^a   Bingham, Nicholas ^a   Hordagoda, Mahesh ^a   Phan, Manh Huong ^a   Srikanth, Hariharan ^a   Witanachchi, Sarath ^a   Mukherjee, Pritish ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMICALLY SHARP INTERFACE; BI-LAYER; BI-LAYER FILMS; BILAYER THIN FILMS; COMPOSITE THIN FILMS; COMPRESSIVE STRAIN; EPITAXIAL RELATIONSHIPS; FERRIMAGNETIC ORDERING; FLAT INTERFACE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; IN-PLANE COMPRESSIVE STRAIN; INTERFACIAL COUPLINGS; INTERFACIAL STRAIN; LATTICE-MATCHED; MGO SUBSTRATE; MGO(1 0 0); PULSED-LASER DEPOSITION TECHNIQUE; SENSOR DEVICE; SINGLE CRYSTAL SUBSTRATES; SINGLE LAYER FILMS; SINGLE-CRYSTALLINE; SRTIO; SURFACE MAGNETISM; TECHNOLOGICAL APPLICATIONS; TETRAGONAL DISTORTION; XRD;

EPITAXIAL GROWTH; FERRIMAGNETISM; INTERFACES (MATERIALS); MAGNETIC PROPERTIES; MANGANESE OXIDE; PULSED LASER DEPOSITION; SATURATION MAGNETIZATION; SENSORS; STRAIN; THIN FILMS; X RAY DIFFRACTION;

MANGANESE;

EID: 84868378655     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4759237     Document Type: Article

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