Electric-field sensing near the surface microstructure of an atom chip using cold Rydberg atoms

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 86, Issue 5, 2012, Pages

  Carter, J D ^a   Cherry, O ^a   Martin, J D D ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM CHIPS; ATOMIC SENSITIVITY; COLD ATOMS; COLD RYDBERG ATOMS; MEASURED FIELD; QUANTUM SYSTEM; RYDBERG EXCITATION; SURFACE MICROSTRUCTURES; VOLTAGE BIASING;

ELECTRIC FIELDS; QUANTUM ELECTRONICS; QUANTUM OPTICS; RYDBERG STATES; WIRE;

ATOMS;

EID: 84868353704     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.86.053401     Document Type: Article

References (32)

1. A. S. Sørensen, C. H. van der Wal, L. I. Childress, and M. D. Lukin, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.063601 92, 063601 (2004).
2. S. D. Hogan, J. A. Agner, F. Merkt, T. Thiele, S. Filipp, and A. Wallraff, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.108.063004 108, 063004 (2012).
3. A. André, D. DeMille, J. M. Doyle, M. D. Lukin, S. E. Maxwell, P. Rabi, R. J. Schoelkopf, and P. Zoller, Nat. Phys. 1745-2473 10.1038/nphys386 2, 636 (2006). (Pubitemid 44328351)
4. L. Isenhower, E. Urban, X. L. Zhang, A. T. Gill, T. Henage, T. A. Johnson, T. G. Walker, and M. Saffman, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.104.010503 104, 010503 (2010).
5. A. Gaëtan, Y. Miroshnychenko, T. Wilk, A. Chotia, M. Viteau, D. Comparat, P. Pillet, A. Browaeys, and P. Grangier, Nat. Phys. 1745-2473 10.1038/nphys1183 5, 115 (2009).
6. T. F. Gallagher, Rydberg Atoms (Cambridge University Press, Cambridge, 1994).
7. A. Osterwalder and F. Merkt, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.82.1831 82, 1831 (1999).
8. J. A. Sedlacek, A. Schwettmann, H. Kübler, R. Löw, T. Pfau, and J. P. Shaffer, Nat. Phys. (2012), doi: 10.1038/nphys2423.
9. S. B. Hill, C. B. Haich, Z. Zhou, P. Nordlander, and F. B. Dunning, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.85.5444 85, 5444 (2000). (Pubitemid 32089652)
10. Y. Pu, D. D. Neufeld, and F. B. Dunning, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.81.042904 81, 042904 (2010).
11. M. S. Rzchowski and J. R. Henderson, Phys. Rev. A 1050-2947 10.1103/PhysRevA.38.4622 38, 4622 (1988).
12. J. D. Carter and J. D. D. Martin, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.83.032902 83, 032902 (2011).
13. G. H. Low, P. F. Herskind, and I. L. Chuang, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.84.053425 84, 053425 (2011).
14. M. Müller, H. Haakh, T. Calarco, C. Koch, and C. Henkel, Quant. Info. Proc. 1570-0755 10.1007/s11128-011-0296-0 10, 771 (2011).
15. R. P. Abel, C. Carr, U. Krohn, and C. S. Adams, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.84.023408 84, 023408 (2011).
16. J. Fortágh and C. Zimmermann, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.79.235 79, 235 (2007). (Pubitemid 46204615)
17. J. Reichel and V. Vuletić, Atom Chips (John Wiley & Sons, Weinheim, Germany, 2011).
18. Y.-J. Lin, I. Teper, C. Chin, and V. Vuletić, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.050404 92, 050404 (2004).
19. A. Tauschinsky, R. M. T. Thijssen, S. Whitlock, H. B. van Linden van den Heuvell, and R. J. C. Spreeuw, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.81.063411 81, 063411 (2010).
20. R. Löw, H. Weimer, J. Nipper, J. B. Balewski, B. Butscher, H. P. Büchler, and T. Pfau, J. Phys. B: At. Mol. Opt. Phys. JPAPEH 0953-4075 10.1088/0953-4075/45/11/113001 45, 113001 (2012).
21. S. Wildermuth, P. Krüger, C. Becker, M. Brajdic, S. Haupt, A. Kasper, R. Folman, and J. Schmiedmayer, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.69.030901 69, 030901 (2004).
22. J.-H. Choi, J. R. Guest, A. P. Povilus, E. Hansis, and G. Raithel, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95.243001 95, 243001 (2005). (Pubitemid 41776847)
23. P. Hyafil, J. Mozley, A. Perrin, J. Tailleur, G. Nogues, M. Brune, J. M. Raimond, and S. Haroche, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett. 93.103001 93, 103001 (2004).
24. O. Cherry, J. D. Carter, and J. D. D. Martin, Can. J. Phys. CJPHAD 0008-4204 10.1139/P09-043 87, 633 (2009).
25. C. E. Liekhus-Schmaltz, R. Mantifel, M. Torabifard, I. B. Burgess, and J. D. D. Martin, J. Opt. Soc. Am. B JOBPDE 0740-3224 10.1364/JOSAB.29.001394 29, 1394 (2012).
26. B. Deal, IEEE Trans. Electron Devices IETDAI 0018-9383 10.1109/T-ED.1980.19908 27, 606 (1980).
27. J. M. Obrecht, R. J. Wild, and E. A. Cornell, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.75.062903 75, 062903 (2007). (Pubitemid 47139172)
28. H. Hattermann, M. Mack, F. Karlewski, F. Jessen, D. Cano, and J. Fortágh, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.86.022511 86, 022511 (2012).
29. V. Sandoghdar, C. I. Sukenik, S. Haroche, and E. A. Hinds, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.53.1919 53, 1919 (1996).
30. P. Krüger, X. Luo, M. W. Klein, K. Brugger, A. Haase, S. Wildermuth, S. Groth, I. Bar-Joseph, R. Folman, and J. Schmiedmayer, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.91.233201 91, 233201 (2003).
31. J. Bylander, S. Gustavsson, F. Yan, F. Yoshihara, K. Harrabi, G. Fitch, D. G. Cory, Y. Nakamura, J.-S. Tsai, and W. D. Oliver, Nat. Phys. 1745-2473 10.1038/nphys1994 7, 565 (2011).
32. A. Safavi-Naini, P. Rabl, P. F. Weck, and H. R. Sadeghpour, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.84.023412 84, 023412 (2011).