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Volumn 101, Issue 17, 2012, Pages

Causes of driving voltage rise in phosphorescent organic light emitting devices during prolonged electrical driving

Author keywords

[No Author keywords available]

Indexed keywords

2-PHENYLPYRIDINE; BLOCKING LAYERS; DRIVING VOLTAGES; ELECTRICAL DRIVING; EMISSION LAYERS; GUEST MOLECULES; HOST:GUEST; ORGANIC LIGHT-EMITTING DEVICES;

EID: 84868033727     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4764021     Document Type: Article
Times cited : (16)

References (23)
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  • 9
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    • Chin, B.D.1    Lee, C.2
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    • 80053377412 scopus 로고    scopus 로고
    • 10.1016/j.orgel.2011.08.023
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    • (2011) Org. Electron. , vol.12 , pp. 2056-2060
    • Siboni, H.Z.1    Aziz, H.2
  • 15
    • 0000245133 scopus 로고    scopus 로고
    • 10.1063/1.371395
    • I. G. Hill and A. Kahn, J. Appl. Phys. 86, 4515-4519 (1999). 10.1063/1.371395
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    • Hill, I.G.1    Kahn, A.2
  • 17
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    • Lee, J.Y.1
  • 22
    • 84868026095 scopus 로고    scopus 로고
    • See supplementary material at http://dx.doi.org/10.1063/1.4764021 E-APPLAB-101-066244 that includes voltage stability measurement result of a device containing a second dopant near the EML/HBL interface as an e-h recombination center, showing the improvement of voltage stability due to the consumption of residual holes at this interface.
  • 23
    • 69249189552 scopus 로고    scopus 로고
    • 10.1063/1.3210790
    • Y. Luo and H. Aziz, Appl. Phys. Lett. 95, 073304 (2009). 10.1063/1.3210790
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 073304
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.