-
1
-
-
0035848248
-
-
10.1063/1.1355007
-
C. Adachi, M. A. Baldo, S. R. Forrest, S. Lamansky, M. E. Thompson, and R. C. Kwong, Appl. Phys. Lett. 78, 1622-1624 (2001). 10.1063/1.1355007
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 1622-1624
-
-
Adachi, C.1
Baldo, M.A.2
Forrest, S.R.3
Lamansky, S.4
Thompson, M.E.5
Kwong, R.C.6
-
2
-
-
77955995947
-
-
10.1016/j.orgel.2010.07.015
-
J. H. Seo, S. J. Lee, B. M. Seo, S. J. Moon, K. H. Lee, J. K. Park, S. S. Yoon, and Y. K. Kim, Org. Electron. 11, 1759-1766 (2010). 10.1016/j.orgel.2010. 07.015
-
(2010)
Org. Electron.
, vol.11
, pp. 1759-1766
-
-
Seo, J.H.1
Lee, S.J.2
Seo, B.M.3
Moon, S.J.4
Lee, K.H.5
Park, J.K.6
Yoon, S.S.7
Kim, Y.K.8
-
3
-
-
79951670501
-
-
10.1016/j.ca2010.07.024
-
W. S. Jeon, C. Kulshreshtha, J. H. Yu, M. J. Lim, J. S. Park, and J. H. Kwon, Curr. Appl. Phys. 11, 311-314 (2011). 10.1016/j.cap.2010.07.024
-
(2011)
Curr. Appl. Phys.
, vol.11
, pp. 311-314
-
-
Jeon, W.S.1
Kulshreshtha, C.2
Yu, J.H.3
Lim, M.J.4
Park, J.S.5
Kwon, J.H.6
-
4
-
-
47749104922
-
-
10.1063/1.2951960
-
R. Meerheim, S. Scholz, S. Olthof, G. Schwartz, S. Reineke, K. Walzer, and K. Leo, J. Appl. Phys. 104, 014510 (2008). 10.1063/1.2951960
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 014510
-
-
Meerheim, R.1
Scholz, S.2
Olthof, S.3
Schwartz, G.4
Reineke, S.5
Walzer, K.6
Leo, K.7
-
5
-
-
0033583208
-
-
10.1126/science.283.5409.1900
-
H. Aziz, Z. D. Popovic, N. Hu, A. Hor, and G. Xu, Science 283, 1900-1902 (1999). 10.1126/science.283.5409.1900
-
(1999)
Science
, vol.283
, pp. 1900-1902
-
-
Aziz, H.1
Popovic, Z.D.2
Hu, N.3
Hor, A.4
Xu, G.5
-
9
-
-
34548309439
-
-
10.1002/adma.200602509
-
B. D. Chin and C. Lee, Adv. Mater. 19, 2061-2066 (2007). 10.1002/adma.200602509
-
(2007)
Adv. Mater.
, vol.19
, pp. 2061-2066
-
-
Chin, B.D.1
Lee, C.2
-
10
-
-
40149086223
-
-
10.1063/1.2884530
-
N. C. Giebink, B. W. D Andrade, M. S. Weaver, P. B. Mackenzie, J. J. Brown, M. E. Thompson, and S. R. Forrest, J. Appl. Phys. 103, 044509 (2008). 10.1063/1.2884530
-
(2008)
J. Appl. Phys.
, vol.103
, pp. 044509
-
-
Giebink, N.C.1
Andrade B W, D.2
Weaver, M.S.3
MacKenzie, P.B.4
Brown, J.J.5
Thompson, M.E.6
Forrest, S.R.7
-
11
-
-
67650215307
-
-
10.1063/1.3151689
-
N. C. Giebink, B. W. DAndrade, M. S. Weaver, J. J. Brown, and S. R. Forrest, J. Appl. Phys. 105, 124514 (2009). 10.1063/1.3151689
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 124514
-
-
Giebink, N.C.1
Dandrade, B.W.2
Weaver, M.S.3
Brown, J.J.4
Forrest, S.R.5
-
12
-
-
0037439323
-
-
10.1063/1.1531231
-
D. Y. Kondakov, J. R. Sandifer, C. W. Tang, and R. H. Young, J. Appl. Phys. 93, 1108-1119 (2003). 10.1063/1.1531231
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 1108-1119
-
-
Kondakov, D.Y.1
Sandifer, J.R.2
Tang, C.W.3
Young, R.H.4
-
14
-
-
80053377412
-
-
10.1016/j.orgel.2011.08.023
-
H. Z. Siboni and H. Aziz, Org. Electron. 12, 2056-2060 (2011). 10.1016/j.orgel.2011.08.023
-
(2011)
Org. Electron.
, vol.12
, pp. 2056-2060
-
-
Siboni, H.Z.1
Aziz, H.2
-
15
-
-
0000245133
-
-
10.1063/1.371395
-
I. G. Hill and A. Kahn, J. Appl. Phys. 86, 4515-4519 (1999). 10.1063/1.371395
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 4515-4519
-
-
Hill, I.G.1
Kahn, A.2
-
16
-
-
34548748152
-
-
S. C. Xia, R. C. Kwong, V. I. Adamovich, M. S. Weaver, and J. J. Brown, in IEEE International Proceedings of 45th Annual Reliability Physics Symposium, 2007, pp. 253-257.
-
(2007)
IEEE International Proceedings of 45th Annual Reliability Physics Symposium
, pp. 253-257
-
-
Xia, S.C.1
Kwong, R.C.2
Adamovich, V.I.3
Weaver, M.S.4
Brown, J.J.5
-
17
-
-
33750025318
-
-
10.1063/1.2360223
-
J. Y. Lee, Appl. Phys. Lett. 89, 153503 (2006). 10.1063/1.2360223
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 153503
-
-
Lee, J.Y.1
-
18
-
-
34249877393
-
-
10.1063/1.2745224
-
J. Kang, S. Lee, H. Park, W. Jeong, K. Yoo, Y. Park, and J. Kim, Appl. Phys. Lett. 90, 223508 (2007). 10.1063/1.2745224
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 223508
-
-
Kang, J.1
Lee, S.2
Park, H.3
Jeong, W.4
Yoo, K.5
Park, Y.6
Kim, J.7
-
19
-
-
78650349173
-
-
10.1063/1.3527085
-
D. Song, S. Zhao, Y. Luo, and H. Aziz, Appl. Phys. Lett. 97, 243304 (2010). 10.1063/1.3527085
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 243304
-
-
Song, D.1
Zhao, S.2
Luo, Y.3
Aziz, H.4
-
20
-
-
79751526213
-
-
10.1016/j.orgel.2011.01.008
-
D. Song, Q. Wang, S. Zhao, and H. Aziz, Org. Electron. 12, 582-588 (2011). 10.1016/j.orgel.2011.01.008
-
(2011)
Org. Electron.
, vol.12
, pp. 582-588
-
-
Song, D.1
Wang, Q.2
Zhao, S.3
Aziz, H.4
-
21
-
-
10044296275
-
-
10.1063/1.1813628
-
N. Matsusue, S. Ikame, Y. Suzuki, and H. Naito, Appl. Phys. Lett. 85, 4046-4048 (2004). 10.1063/1.1813628
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 4046-4048
-
-
Matsusue, N.1
Ikame, S.2
Suzuki, Y.3
Naito, H.4
-
22
-
-
84868026095
-
-
See supplementary material at http://dx.doi.org/10.1063/1.4764021 E-APPLAB-101-066244 that includes voltage stability measurement result of a device containing a second dopant near the EML/HBL interface as an e-h recombination center, showing the improvement of voltage stability due to the consumption of residual holes at this interface.
-
-
-
-
23
-
-
69249189552
-
-
10.1063/1.3210790
-
Y. Luo and H. Aziz, Appl. Phys. Lett. 95, 073304 (2009). 10.1063/1.3210790
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 073304
-
-
Luo, Y.1
Aziz, H.2
|