Hard x-ray photoelectron spectroscopy study on band alignment at poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)/ZnO interface

Applied Physics Letters

Volumn 101, Issue 17, 2012, Pages

  Nagata, T ^a   Oh, S ^a,b   Yamashita, Y ^a   Yoshikawa, H ^a   Hayakawa, R ^a   Kobayashi, K ^a   Chikyow, T ^a   Wakayama, Y ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND ALIGNMENTS; BANDBENDING; CHARGE INJECTION BARRIERS; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; PEDOT:PSS; POLY(STYRENE SULFONATE); POLY-3 ,4-ETHYLENEDIOXYTHIOPHENE; SCHOTTKY; ZNO; ZNO LAYERS; ZNO SINGLE CRYSTALS;

BAND STRUCTURE; CONDUCTING POLYMERS; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ZINC OXIDE;

EID: 84868031924     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4762834     Document Type: Article

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