Authentication of bee pollen grains in bright-field microscopy by combining one-class classification techniques and image processing

Microscopy Research and Technique

Volumn 75, Issue 11, 2012, Pages 1475-1485

  Chica, Manuel ^a,b  

^a Tecnologías Avanzadas Inspiralia ITAV   (Spain)

^b EUROPEAN CENTRE FOR SOFT COMPUTING   (Spain)

Author keywords

Classification; Computer vision; Microscopic imaging; Outliers detection; Pollen grains

Indexed keywords

AUTHENTICATION; IMAGE CLASSIFICATION;

BRIGHT-FIELD MICROSCOPY; CLASSIFICATION IMAGES; IMAGES PROCESSING; MICROSCOPIC IMAGING; NOVEL METHODS; ONE-CLASS CLASSIFICATION; ONE-CLASS CLASSIFICATION TECHNIQUES; ONE-CLASS CLASSIFIER; OUTLIER DETECTION; POLLEN GRAINS;

COMPUTER VISION;

APOIDEA;

EID: 84868004563     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.22091     Document Type: Article

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