Tackling intracell variability in TLC Flash through tensor product codes

IEEE International Symposium on Information Theory - Proceedings

Volumn , Issue , 2012, Pages 1000-1004

  Gabrys, Ryan ^a   Yaakobi, Eitan ^b,c   Grupp, Laura ^b   Swanson, Steven ^b   Dolecek, Lara ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIT-ERRORS; ERROR CORRECTION CODES; ERROR CORRECTION CODING; ERROR PATTERNS; ERROR-CORRECTION SCHEMES; MODEL-BASED OPC; MULTI-LEVEL CELL FLASH MEMORY; PHYSICAL CHARACTERISTICS; STORAGE TECHNOLOGY; TENSOR PRODUCTS;

ERROR CORRECTION; INFORMATION THEORY; INVENTORY CONTROL; MATHEMATICAL MODELS;

FLASH MEMORY;

EID: 84867552666     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIT.2012.6282078     Document Type: Conference Paper

References (13)

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