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Volumn 5, Issue 2, 2010, Pages 123-128
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Microscopic and optical characterization of Cd 0.8Zn 0.2S thin film
a,b
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Author keywords
AFM; CdZnS Thin Films; Nanostructures; Photoluminescence; SEM; X Ray Diffraction
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Indexed keywords
AFM;
AVERAGE HEIGHT;
CHEMICAL BONDINGS;
CHEMICAL-BATH DEPOSITION;
DISLOCATION DENSITIES;
OPTICAL CHARACTERIZATION;
RMS ROUGHNESS;
ROOM-TEMPERATURE PHOTOLUMINESCENCE;
ROOT MEAN SQUARE;
S THIN FILMS;
STRUCTURAL PARAMETER;
SURFACE TEXTURES;
ULTRASONICALLY CLEANED GLASS SUBSTRATES;
UV-VIS-NIR SPECTROSCOPY;
ATOMIC FORCE MICROSCOPY;
CHEMICAL BONDS;
DEPOSITS;
NANOSTRUCTURES;
OPTICAL PROPERTIES;
PHOTOELECTRONS;
PHOTOLUMINESCENCE;
PHOTOLUMINESCENCE SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC;
VAPOR DEPOSITION;
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EID: 84867550793
PISSN: 21567573
EISSN: 21567581
Source Type: Journal
DOI: 10.1166/jamr.2010.1033 Document Type: Review |
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Times cited : (3)
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References (20)
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