Wide angle x-ray diffraction studies of nanocrystalline lead europium sulfide

Materials Letters

Volumn 89, Issue , 2012, Pages 198-201

  Kelly, John G ^a   He, Weidong ^b   Somarajan, Suseela ^b,c   Yager, Kevin G ^d   Dickerson, James H ^b,c  

^a TENNESSEE STATE UNIVERSITY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Dilute magnetic semiconductor; Nanoparticle; Rare earth; Thermolysis

Indexed keywords

CRYSTALLINITIES; DEVICE APPLICATION; DILUTE MAGNETIC SEMICONDUCTORS; HIGH PURITY; LEAD SULFIDE; NANOCRYSTALLINES; TERNARY MATERIALS; WIDE ANGLE X-RAY SCATTERING; WIDE ANGLE XRAY DIFFRACTION;

LEAD; NANOCRYSTALS; NANOPARTICLES; PHASE SEPARATION; RARE EARTHS; SULFUR COMPOUNDS; THERMOLYSIS; X RAY DIFFRACTION;

EUROPIUM;

EID: 84867549694     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.08.093     Document Type: Article

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