Optical properties of nanostructured TiO2 thin films and their application as antireflection coatings on infrared detectors

Optics Letters

Volumn 37, Issue 20, 2012, Pages 4302-4304

  Jayasinghe, R C ^a   Perera, A G U ^a   Zhu, H ^b,c   Zhao, Y ^b  

^a GEORGIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF GEORGIA   (United States)

^c SOUTHWEST JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AR COATINGS; COATING MATERIAL; EFFECTIVE COUPLING; FABRY-PEROT OSCILLATIONS; GRADED INDEX; INCOMING LIGHT; INFRARED REGIONS; NANOROD LAYERS; NANORODS GROWN; NANOSTRUCTURED TIO; NORMAL INCIDENCE; OBLIQUE ANGLES; SI SUBSTRATES; SPECTRAL RANGE; TIO;

COATINGS; FILM PREPARATION; GALLIUM NITRIDE; INFRARED DETECTORS; NANORODS; OPTICAL PROPERTIES; OPTIMIZATION; TITANIUM DIOXIDE;

ANTIREFLECTION COATINGS;

EID: 84867454176     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.004302     Document Type: Article

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