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Applied Physics Letters

Volumn 95, Issue 26, 2009, Pages

Direct measurements of the penetration depth in a superconducting film using magnetic force microscopy

(6) Nazaretski, E a,b Thibodaux, J P c Vekhter, I c Civale, L a Thompson, J D a Movshovich, R a

a LOS ALAMOS NATIONAL LABORATORY (United States)

b BROOKHAVEN NATIONAL LABORATORY (United States)

c LOUISIANA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MAGNETIZATION; DIRECT MEASUREMENT; HEIGHT PROFILES; LOCAL MEASUREMENT; MAGNETIC PENETRATION DEPTH; PENETRATION DEPTH; QUANTITATIVE EXTRACTION; SUPERCONDUCTING NB FILM;

DISTANCE MEASUREMENT; SUPERCONDUCTING MAGNETS; SUPERCONDUCTIVITY;

MAGNETIC FORCE MICROSCOPY;

EID: 73649133654 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3276563 Document Type: Article

Times cited : (24)

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