Measurement of the magnetic penetration depth of a superconducting MgB 2 thin film with a large intraband diffusivity

Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 2, 2012, Pages

  Kim, Jeehoon ^a   Haberkorn, N ^a   Lin, Shi Zeng ^a   Civale, L ^a   Nazaretski, E ^b   Moeckly, B H ^c   Yung, C S ^c   Thompson, J D ^a   Movshovich, R ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c SUPERCONDUCTOR TECHNOLOGIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84863699969     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.024501     Document Type: Article

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