Reduced dark counts in optimized geometries for superconducting nanowire single photon detectors

Optics Express

Volumn 20, Issue 21, 2012, Pages 23610-23616

  Akhlaghi, Mohsen K ^a   Atikian, Haig ^b   Eftekharian, Amin ^a   Loncar, Marko ^b   Hamed Majedi, A ^a,b  

^a UNIVERSITY OF WATERLOO   (Canada)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE PHOTODIODES; SUPERCONDUCTIVITY;

CURRENT CROWDING; DARK COUNT RATE; DARK COUNTS; OPTIMIZED GEOMETRIES; PHOTORESPONSES; SINGLE-PHOTON DETECTORS; SUPERCONDUCTING NANOWIRE;

NANOWIRES;

NANOTUBE;

ARTICLE; ARTIFACT; CHEMISTRY; ELECTRIC CONDUCTIVITY; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; PHOTOMETRY; PHOTON; RADIATION EXPOSURE; ULTRASTRUCTURE;

ARTIFACTS; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; NANOTUBES; PHOTOMETRY; PHOTONS;

EID: 84867290145     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.023610     Document Type: Article

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