Spherical cap-shaped emulsion films: Thickness evaluation at the nanoscale level by the optical evanescent wave effect

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 413, Issue , 2012, Pages 101-107

  Gabrieli, R ^a   Loglio, G ^b   Pandolfini, P ^b   Fabbri, A ^a   Simoncini, M ^a   Kovalchuk, V I ^c   Noskov, B A ^d   Makievski, A V ^e   Kragel J ^f   Miller, R ^f   Ravera, F ^g   Liggieri, L ^g  

^a SELEX Galileo   (Italy)

^b UNIVERSITY OF FLORENCE   (Italy)

^c INSTITUTE OF BIOCOLLOID CHEMISTRY   (Ukraine)

^d ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^e SINTERFACE Technologies   (Germany)

^f MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^g CNR   (Italy)

Author keywords

Aqueous solution of sodium dodecyl sulfate; Emulsion film; Liquid film tensiometer; Liquid liquid interfacial system; N Decane; Optical evanescent wave

Indexed keywords

EMULSIFICATION; INTERFEROMETRY; LIQUID FILMS; PARAFFINS; SODIUM; SODIUM SULFATE; WAVE EFFECTS;

AQUEOUS EMULSION; CRITICAL MICELLAR CONCENTRATIONS; EVANESCENT WAVE; FUNCTION OF TIME; HYDROCARBON MATRIX; INITIAL FILM; INTERFACIAL SYSTEMS; INTERFEROMETRIC TECHNIQUES; MEASUREMENT TECHNIQUES; N-DECANE; NANOMETRES; NANOSCALE LEVELS; SODIUM DODECYL SULFATE; SODIUM DODECYLSULFATE SOLUTIONS; TEST DATA; THICKNESS VALUE;

ELECTROMAGNETIC WAVE REFLECTION;

DODECYL SULFATE SODIUM; HYDROCARBON;

AQUEOUS SOLUTION; ARTICLE; EMULSION; FILM; INTERFEROMETRY; MICELLE; PRIORITY JOURNAL; THICKNESS;

EID: 84867097025     PISSN: 09277757     EISSN: 18734359     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2012.05.004     Document Type: Article

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