A novel method for studying the dynamic behavior of both plane-parallel and curved thin liquid films

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 123-124, Issue , 1997, Pages 375-381

  Nikolov, A D ^a   Wasan, D T ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

Curved films; Liquid films; Method; Plane parallel; Thinning behavior

Indexed keywords

EMULSIONS; FOAMS; INTERFACES (MATERIALS); MICELLES; MICROSCOPIC EXAMINATION; PRESSURE MEASUREMENT; THICKNESS MEASUREMENT; THIN FILMS;

CURVED THIN LIQUID FILMS; DIFFERENTIAL INTERFERENCE MICROSCOPY;

DISPERSIONS;

OIL; WATER;

ARTICLE; DYNAMICS; EMULSION; FILM; FOAM; FORCE; INTERFEROMETRY; LIQUID; MICELLE; PHASE CONTRAST MICROSCOPY; PRESSURE; PRIORITY JOURNAL; SURFACE PROPERTY; TECHNIQUE; THICKNESS;

EID: 0343907709     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(96)03775-2     Document Type: Article

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