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Volumn 39, Issue 1-4, 2012, Pages 189-194

A new version of coaxial holder with continuous conductor for tests on planar films

Author keywords

Planar film; sample holder; shielding effectiveness

Indexed keywords

COAXIAL TRANSMISSION LINES; COPPER FILMS; FREQUENCY RANGES; PLANAR FILMS; SAMPLE HOLDERS; SHIELDING EFFECTIVENESS;

EID: 84867040241     PISSN: 13835416     EISSN: None     Source Type: Journal    
DOI: 10.3233/JAE-2012-1460     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 1
    • 0024054572 scopus 로고
    • Techniques for measuring the electromagnetic shielding effectiveness of materials: Part I:-Far-field source simulation
    • P.F.Wilson, M.T. Ma and J.W. Adams, Techniques for measuring the electromagnetic shielding effectiveness of materials: Part I:-Far-field source simulation, IEEE Trans on EMC 30 (1988), 239-250.
    • (1988) IEEE Trans on EMC , vol.30 , pp. 239-250
    • Wilson, P.F.1    Ma, M.T.2    Adams, J.W.3
  • 3
    • 77953737125 scopus 로고    scopus 로고
    • Electromagnetic shielding efficiency measurement of composite materials
    • J. Drinovsky and Z. Kejik, Electromagnetic shielding efficiency measurement of composite materials, Measurement Science Review 9 (2009), 109-112.
    • (2009) Measurement Science Review , vol.9 , pp. 109-112
    • Drinovsky, J.1    Kejik, Z.2
  • 4
    • 84867056981 scopus 로고    scopus 로고
    • Standard test method formeasuring the electromagnetic shielding effectiveness of planar materials
    • American Society for Testing and Materials
    • American Society for Testing and Materials, Standard test method formeasuring the electromagnetic shielding effectiveness of planar materials, ASTM Standard D4935-10 (2010), 1-10.
    • (2010) ASTM Standard D , vol.4935 , Issue.10 , pp. 1-10
  • 8
    • 33744538094 scopus 로고    scopus 로고
    • Innovative test method for the shielding effectiveness measurement of conductive thin films in a wide frequency range
    • M.S. Sarto and A. Tamburrano, Innovative test method for the shielding effectiveness measurement of conductive thin films in a wide frequency range, IEEE Trans on EMC 48 (2006), 331-341.
    • (2006) IEEE Trans on EMC , vol.48 , pp. 331-341
    • Sarto, M.S.1    Tamburrano, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.