Innovative test method for the shielding effectiveness measurement of conductive thin films in a wide frequency range

IEEE Transactions on Electromagnetic Compatibility

Volumn 48, Issue 2, 2006, Pages 331-341

  Sarto, Maria Sabrina ^a   Tamburrano, Alessio ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

ASTM D4935 test method; High order equivalent circuit; Shielding effectiveness (SE); Thin films

Indexed keywords

DIELECTRIC FILMS; ELECTRIC CONDUCTIVITY; ELECTRIC SHIELDING; INSERTION LOSSES; SUBSTRATES;

CORRECTION FACTOR; HIGH-ORDER EQUIVALENT CIRCUIT; SHIELDING EFFECTIVENESS; THIN CONDUCTING FILM;

THIN FILM CIRCUITS;

EID: 33744538094     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2006.874664     Document Type: Article

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