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Volumn , Issue , 2012, Pages 678-682

Development of an optimized power delivery system for 3D IC integration with TSV silicon interposer

Author keywords

[No Author keywords available]

Indexed keywords

3D SYSTEMS; DE-COUPLING CAPACITANCE; ELECTRICAL PERFORMANCE; ENGINEERING EVALUATIONS; IMPEDANCE CHARACTERISTICS; LOSS MECHANISMS; LOWER-POWER CONSUMPTION; MICRO-BUMPS; MIM CAPACITORS; MULTI-CHIP; PERFORMANCE IMPACT; PHYSICAL INTERFACE; POWER DELIVERY NETWORK; POWER DELIVERY SYSTEMS; RE-DISTRIBUTION; TEST VEHICLE; THROUGH-SILICON-VIA; WIRING DENSITY;

EID: 84866878729     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2012.6248905     Document Type: Conference Paper
Times cited : (32)

References (5)
  • 1
    • 33746875623 scopus 로고    scopus 로고
    • 3-D silicon intergration and silicon packaging technology using silicon through-vias
    • Knickerbocker, J.U., et al "3-D silicon intergration and silicon packaging technology using silicon through-vias," IEEE Journal of Solid-State Circuits, Vol. 41, No.8 (2006), page 1718- 1725
    • (2006) IEEE Journal of Solid-State Circuits , vol.41 , Issue.8 , pp. 1718-1725
    • Knickerbocker, J.U.1
  • 4
    • 84866855557 scopus 로고    scopus 로고
    • On-Die Capacitance Measurement and Impact o Product Performance
    • Larry Smith, Zhe Li, et al "On-Die Capacitance Measurement and Impact o Product Performance" DesignCon 2011
    • DesignCon 2011
    • Smith, L.1    Li, Z.2
  • 5
    • 84866881503 scopus 로고    scopus 로고
    • Analysis of FPGA PDN Noise Propagation by Die/Package 3D Modeling
    • Zhe Li, Hong Shi, "Analysis of FPGA PDN Noise Propagation by Die/Package 3D Modeling" DesignCon 2010
    • DesignCon 2010
    • Li, Z.1    Shi, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.